Design of Circuit Equipment Conduction Test Device Based on Single Chip Microcomputer
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School of Instruments and Electronics, North University of China, Taiyuan 030051, China

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TP2

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    Abstract:

    High In today's highly information-based, highly automated and highly integrated technology era, multi-core cables are increasingly used in large-scale electrical equipment. Multi-core cable will be affected by various external environments, so it is very easy to fail. The performance of multi-core cable has become an important factor affecting the overall reliability of the system. At present, cable detection is always difficult. At present, the main detection means is manual detection. In view of the above problems, this paper designs and studies a circuit equipment conduction test device. In this device, ATmega64 single chip microcomputer is taken as its core control component, CD4051 chip is used to select the conduction test channel, TLP521-4 chip is used to isolate the digital signal, and then the measured conduction result data is transmitted to the single chip microcomputer and transmitted with serial port assistant through MAX232 chip. Finally, the test system is tested to obtain the test results and analyze the results.

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  • Received:
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  • Online: June 14,2024
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