Study on test methods of UHF passive RFID IC
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China Electronics Standardization Institute, Beijing 100176, China

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TN06

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    Abstract:

    The purpose of this paper is to standardize steps, conditions, influence factors and matters need attention in UHF passive RFID chip testing, which help to make a decision in standard drafting. By investigation into the need and present research situation of domestic UHF RFID chip, we summarized the experimental requirements of RFID chip’s performance evaluation. “UHF passive RFID chip testing methods (draft)” is formed by working with several RFID design teams, which the first domestic UHF RFID chip test for comparison is based on. The results show that the read sensitivity performance of domestic chip can be less than -13 dBm in high and low temperature conditions, write sensitivity less than -11 dBm, and maximum power larger than 20 dBm, which still need to be improved to compare with international mainstream technology. Based on further analysis on test results, the standard test methods summarized in this paper can be used to evaluate the performance of the chip, and can be used in design, manufacture and application effectively.

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  • Received:
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  • Online: January 30,2018
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