Digital management technology of LCD driver chip test based on EtherCAT
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Beijing Key Laboratory of IC Test Technology,Beijing Institute of Automatic Test Technology,Beijing 100088, China

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TP274

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    Abstract:

    LCD drive chip testing throughout the whole design, manufacturing and application process, the chip test is an important means to ensure the quality of the drive chip. Because the test system needs to match many different models of the driver chip, the test items and test signals of a single model chip are huge, if use the way of manual record, the test efficiency will be low and management costs will be high. It is necessary to develop digital management technology for the whole test system under this situation, the test equipment, persons and data can be managed through using this new technology. In order to make the data exchange realtime and efficient, the EtherCAT technology has been used in this system. After that, the client of the equipment and server can work closely. The test of system shows that the technology can conveniently record the data in the test process; it also has strong scalability, if want to update the whole system only need to add client device or hardware module and upgrade of the system software.

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  • Received:
  • Revised:
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  • Online: November 24,2016
  • Published: