The existing defect detection methods for photovoltaic panels mostly use methods such as electroluminescence excitation and area array camera, which have problems such as complex operation and low efficiency. Therefore, research on photoluminescence imaging system for photovoltaic panels based on linear array InGaAs camera is carried out. Firstly, design the hardware and logic framework of the linear InGaAs camera, and use FPGA to drive the linear InGaAs camera to complete data acquisition and image display. By using fixed mode noise removal algorithm and histogram bidirectional equalization algorithm, fixed mode noise in defect images was removed, while improving the contrast and clarity of the images. Finally, by building an overall imaging system and conducting imaging experiments on various defects of different types of photovoltaic panels through photoluminescence imaging, with a detection accuracy of 0.2 mm/pixel. The experimental results show that the system can detect defects such as hidden cracks, black spots, damaged chips, mixed grades, and dirt in monocrystalline silicon and polycrystalline silicon photovoltaic panels.